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The complex processing steps in cell manufacturing have to be operated efficiently and therefore being controlled permanently. Our customer-specific inspection modules help you to detect faulty cells/wafers and production drifts as soon as possible., Geometry inspection of Loader The geometries of cells/wafers are measured inline with high accuracy for detecting errors like chippings, cracks and breakages as well as surface defects, e.g. contaminations., ARC The inspection tasks ranges from a simple colour classification with a colour camera to the determination of optical parameters (coating thicknesses, refractive indices, extinction coefficients) of the ARC coating layers via two-dimensionally spectral reflectometry., Print inspection and laser control With resolutions from 75 µm down to 10 µm each printing step (front contact, back contact, back field) or laser process can be controlled inline. The error detection ranges from simple print layout and position control (also laser holes) to finger broadenings and paste stains as far as profile measurements.
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